Automated Characterization of Single-Photon Avalanche Photodiode

Authors

  • Aina Mardhiyah M. Ghazali
  • Audun Nystad Bugge
  • Sebastien Sauge
  • Vadim Makarov

DOI:

https://doi.org/10.31436/iiumej.v12i5.243

Abstract

We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 µW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer.

ABSTRAK: Kami melaporkan pencirian pengesan foton tunggal secara automatik berdasarkan kepada diod foto runtuhan silikon (silicon avalanche photodiode) (PerkinElmer C30902SH) komersial. Pencirian  diod foto adalah berdasarkan kepada plot arus-voltan (I-V) pada tahap pencahayaan yang berbeza (kelam - tanpa cahaya, 10pW, dan 10µW), kadar bacaan latar belakang, kecekapan pengesanan foton pada voltan picuan yang berbeza. Pengaturcaraan C++ digunakan di dalam rutin pencirian automatik melalui komputer dengan sistem pengendalian LINUX.

KEYWORDS: avalanche photodiode (APD); single photon detector; photon counting; experiment automation

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Published

2012-01-04

How to Cite

M. Ghazali, A. M., Bugge, A. N., Sauge, S., & Makarov, V. (2012). Automated Characterization of Single-Photon Avalanche Photodiode. IIUM Engineering Journal, 12(5). https://doi.org/10.31436/iiumej.v12i5.243